[1]    J.L. Velázquez, A. Ferrero, A. Pons, J. Campos and M.L. Hernanz, “Zernike polynomials for photometric characterization of LEDs,” Journal of Optica, Jan 2016, Number 18, Issue 2, pp.1-9

[2]    U. Krüger, P. Blattner, R. Hornischer, W. Bechter, W. Steudtner and W. Jordan, “Measurement uncertainty of photometric measurements considering the requirements of the new international standard CIE S 025 / E:2015 "Test Method for LED Lamps, LED Luminaires and LED Modules,” in Proceedings of the 28th Session of the CIE Manchester, United Kingdom, 28 June – 4 July 2015

[3]  J.L. Velázquez, A. Ferrero, A. Pons, J. Campos and M.L. Hernanz, “Photometric characterization of extended sources by subsource goniospectroradiometry,” in Proceedings of the CIE Tutorial and Expert Symposium on the  CIE S 025 LED Lamps, LED Luminaires and LED Modules Test Standard, 26 November 2015, Braunshweig, Germany, pp.24-33, 2015

[4]    A. Sperling, S. Penda, M. Taddeo, E Revtova, D. Renoux, P. Blattner, T. Poikonen, W. Jordan, “Multiple Transfer Standard for characterisation of sphere test setups,” in Proceedings of the CIE Tutorial and Expert Symposium on the  CIE S 025 LED Lamps, LED Luminaires and LED Modules Test Standard, 26 November 2015, Braunshweig, Germany, pp.1-5, 2015

[5]    J. Huang, D.S. Golubović, S. Koh, D. Yang, X. Li, X. Fan and G.Q. Zhang, “Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test,” Reliability Engineering and System Safety 154, pp.152–159

[6]   B. Sun, X. Fan, L. Li, H. Ye, W. van Driel and G.Q. Zhang, “A Reliability Evaluation for Electrolytic Capacitor Free LED Driver,” submitted to IEEE transaction on Components, Packaging and Manufacturing Technology, 2016

[7]   J. Fan, C. Qian, M. Zhang, Y. Li, X. Fan and G.Q. Zhang, “Thermal/Luminescence Characterization and Degradation Mechanism Analysis on Phosphor-converted White LED Chip Scale Packages,” submitted to Microelectronic Reliability, 2016

[8]   D. Zhao, G. Rietveld, J.-P. Braun, F. Overney, T. Lippert and A. Christensen, “Traceable measurements of the electrical parameters of solid-state lighting products,” Metrologia, 2016, 53(6): pp.1384-1394

[9]    D. Zhao, “AC powered SSL lamps load impedance characterisation in the time domain,” in Proceedings of the CIE Tutorial and Expert Symposium on the  CIE S 025 LED Lamps, LED Luminaires and LED Modules Test Standard, 26 November 2015, Braunshweig, Germany, pp.38-43, 2015

[10]  J. Ledig, S. Fündling, M. Popp, F. Steib, J. Hartmann, H.-H. Wehmann, A. Sperling and A. Waag, “3D GAN LEDs - Technologies and analytics,” in Proceedings of the CIE Tutorial and Expert Symposium on the  CIE S 025 LED Lamps, LED Luminaires and LED Modules Test Standard, 26 November 2015, Braunshweig, Germany, pp.77-85, 2015

[11]  J. Zhang, H. van Zeijl and G.Q. Zhang, “Feasibility of solder crack initiation identification using insitu high precision electrical resistance monitoring,” in Proceedings of the CIE Tutorial and Expert Symposium on the  CIE S 025 LED Lamps, LED Luminaires and LED Modules Test Standard, 26 November 2015, Braunshweig, Germany, pp.86-96, 2015

[12] J. Askola, “Characterization of an Integrating Sphere Setup for Measurements of Organic LEDs,” master thesis of Aalto University, 55p (2015).

[13] Y. Zhu, “Development of Transfer Standards for SSL Measurement,” master thesis of Delft University of Technology, 94p (2017).

[14] J.L.V. Molinero, “Estudio de las propiedades fotométricas de sistemas de iluminación de estado sólido en campo cercano y campo lejano,” PhD Tesis of Universidad de Granada. 2016

[15] P. Iacomussi, M. Radis and G. Rossi, “European EMRP Projects About LED Lighting”, Energy Procedia 78 (2015) 2675-2680

[16] G. Rossi, “The evaluation of measurement uncertainty of SSL luminaire for industrial applications, ” in Proceedings of Lux Europa 2017, Ljubljana, Slovenia, September 18-20, 2017

[17] P. Iacomussi,  G. Rossi, M. Radis, “Flicker effects in tunnel lighting,” in Proceedings of CIE 2017 Midterm Meeting in Jeju, Republic of Korea, October 22–25, 2017

[18] E. Revtova, E. Vuelban, D. Zhao, J. Brenkman, H. Ulden, “Traceability validation of high speed short-pulse testing methods used in LED production,” submitted to International Journal of Metrology and Quality Engineering (IJMQE)

[19] M. Nilsson Tengelin and S. Källberg, “Effects of non-visual optical flicker in an office with two different light sources,” in Proceedings of CIE 2017 Midterm Meeting in Jeju, Republic of Korea, October 22–25, 2017

[20] M. Nilsson Tengelin and S. Källberg, “Measurement of the Effect of Dynamic Lighting on Alertness, Mood and Sleepiness, ” in Proceedings of Lux Europa 2017, Ljubljana, Slovenia, September 18-20, 2017

[21] J. Ledig, A. Avramescu, T. Schimpke, T. Varghese, G. Roßbach, B. Galler, H. Doblinger, T. Gerloff, F. Steib, S. Fündling, M. Strassburg, H.-J. Lugauer, A. Waag and A. Sperling, “Quantitative electroluminescence characteristics of packaged LED devices from ensembles of AlInGaN based core-shell microrods,” in Proceedings of 12th International Conference on Nitride Semiconductors (ICNS-12), Strassburg

[22] J. Hartmann; F. Steib; H. Zhou; J. Ledig; L. Nicolai; S. Fündling; T. Schimpke; J. Hartmann; A. Avramescu; T. Varghese; L. Nicolai; A. Trampert; M. Strassburg; H.-J. Lugauer; H.-H. Wehmann and A. Waag, “Study of 3D-growth conditions for selective area MOVPE of high aspect ratio GaN fins with non-polar vertical sidewalls,” J. Cryst. Growth, vol. 476, pp. 90–98, Oct. 2017

[23] A. Sperling, M. Meyer, T. Gerloff, W. Jordan, E. Revtova, T. Poikonen, D. Renoux and P. Blattner, “Multiple Transfer Standard for Calibration and Characterisation of Test Setups in Industry,” in Proceedings of 13th International Conference on New Developments and Applications in Optical Radiometry (NEWRAD 2017), Tokyo, Japan, June 13-16, 2017